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Machines & equipment for sale

Semi Lab WT-2000 Bench Lifetime Measurement System

Direct From Site Clearance

Price [?]
Please call on +44 (0) 1922 45 8000
Part of a Direct Site Clearance
Semiconductor and Diffusion Equipment
Condition
From a working environment, Excellent Condition, Current Model
Add to Quote Book Appointment
Stock No
TZ272
Model
WT-2000
Year of Manufacture
Light Use
Condition
From a working environment, Excellent Condition, Current Model
Capacity
Wafers upto 300mm
Process Application
Multiple Test Capabilities
Other Info
Tabletop ideal for mid range fabs & Labs
Location
Our Central Warehouse, Aldridge, UK
External Dimensions (WxDxH mm) [?]
Mounted into mobile work station

Description

Semi Lab WT-2000 Bench Lifetime Measurement System

The WT product line is a powerful measurement platform for performing many different semiconductor material characterization measurements.

The base system includes all the overhead functions necessary to perform characterization measurements, including power supplies, computer and operating software, X-Y measurement stage and so on.

The WT-2000 is typically used to make maps, where the wafer is scanned at a programmable raster. Each system is configured to the user’s requirements by adding treatment and measurement capabilities.

The WT-2000 is a tabletop tool, suggested for mid-range fabs and laboratories.

Features and System Specifications:

  • Wafer size: up to 300 mm with bare or dielectric coated surface
  • Wafer handling: manual or Semilab-made indexer
  • Loading options:
    • 100-200 mm cassette indexer
    • 300 mm 13 slot cassette indexer, including open cassettes for 100-300 mm wafers
    • 300 mm 25 slot cassette indexer, including FOUP, FOSB, and open cassettes for 100-300 mm wafers
  • Objectives of detection:
    • Impurities due to heavy metal and transition metal contamination
    • Crystal defects
    • Optional iron concentration determination both in CZ and FZ wafers
  • No wafer thickness limitation
  • Fast measurement speed
  • High lateral resolution
  • Required surface passivation: thermal oxide, chemical passivation or corona charging

Each system can be configured based on the user’s requirements by adding measurement capabilities and automation capabilities described below.

Measurement capabilities:

pdf icon Print / Download Semi Lab WT-2000 Bench Lifetime Measurement System Datasheet

Additional files

Photographs taken prior refurbishment. Our refurbishment service is not available on all machines.