Semi Lab WT-2000 Bench Lifetime Measurement System


Direct From Site Clearance
- Price [?]
- Please call on +44 (0) 1922 45 8000
- Part of a Direct Site Clearance
- Semiconductor and Diffusion Equipment
- Condition
- From a working environment, Excellent Condition, Current Model
- Stock No
- TZ272
- Model
- WT-2000
- Year of Manufacture
- Light Use
- Condition
- From a working environment, Excellent Condition, Current Model
- Capacity
- Wafers upto 300mm
- Process Application
- Multiple Test Capabilities
- Other Info
- Tabletop ideal for mid range fabs & Labs
- Location
- Our Central Warehouse, Aldridge, UK
- External Dimensions (WxDxH mm) [?]
- Mounted into mobile work station
Description
Semi Lab WT-2000 Bench Lifetime Measurement System
The WT product line is a powerful measurement platform for performing many different semiconductor material characterization measurements.
The base system includes all the overhead functions necessary to perform characterization measurements, including power supplies, computer and operating software, X-Y measurement stage and so on.
The WT-2000 is typically used to make maps, where the wafer is scanned at a programmable raster. Each system is configured to the user’s requirements by adding treatment and measurement capabilities.
The WT-2000 is a tabletop tool, suggested for mid-range fabs and laboratories.
Features and System Specifications:
- Wafer size: up to 300 mm with bare or dielectric coated surface
- Wafer handling: manual or Semilab-made indexer
- Loading options:
- 100-200 mm cassette indexer
- 300 mm 13 slot cassette indexer, including open cassettes for 100-300 mm wafers
- 300 mm 25 slot cassette indexer, including FOUP, FOSB, and open cassettes for 100-300 mm wafers
- Objectives of detection:
- Impurities due to heavy metal and transition metal contamination
- Crystal defects
- Optional iron concentration determination both in CZ and FZ wafers
- No wafer thickness limitation
- Fast measurement speed
- High lateral resolution
- Required surface passivation: thermal oxide, chemical passivation or corona charging
Each system can be configured based on the user’s requirements by adding measurement capabilities and automation capabilities described below.
Measurement capabilities:
- µ-PCD for measuring carrier lifetime
- SPV for measuring diffusion length
- VQ for oxide monitoring
- JPV for measuring ion implants
- Eddy current measurement of sheet resistance
Print / Download Semi Lab WT-2000 Bench Lifetime Measurement System Datasheet
Additional files
Photographs taken prior refurbishment. Our refurbishment service is not available on all machines.
Machines & equipment for sale
- Surface Treatment
- Cleaning & Degreasing
- Polishing & Belt Linishing
- Mass Finishing
- Ovens & Furnaces
- Process Cooling
- Shot Blasting
- Dust & Fume Extraction
- Air Compressors
- Rectifiers & Transformers
- Miscellaneous
- Latest Stock
- Special Offers
- Direct From Site Clearances
- Auctions
- Brand New Machines
- Available Immediately
- Sell Your Machine
Machine Alert
Get the latest machines emailed directly to you as they become available to buy online sign up